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Fault-tolerance and reliability techniques for high-density random-access memories / (Record no. 1736)

MARC details
000 -LEADER
fixed length control field	00737nam a2200181Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	190316s2002 gb 000 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number	130084654
040 ## - CATALOGING SOURCE
Original cataloging agency	ECUCL
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title	eng
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number	621.3973 C435
100 #1 - MAIN ENTRY--PERSONAL NAME
Personal name	Kanad Chakraborty, Pinaki Mazumder.
245 00 - TITLE STATEMENT
Title	Fault-tolerance and reliability techniques for high-density random-access memories /
Statement of responsibility, etc.	Kanad Chakraborty, Pinaki Mazumder.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.	N.J :
Name of publisher, distributor, etc.	Prentice Hall,
Date of publication, distribution, etc.	2002.
300 ## - PHYSICAL DESCRIPTION
Extent	xix, 426 p.
490 00 - SERIES STATEMENT
Series statement	Prentice Hall modern semiconductor design series
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note	Includes bibliographical references (p. 377-417) and index.
650 04 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Random access memory
General subdivision	Reliability
--	Integrated circuits
--	Fault tolerance
--	Semiconductor storage devices.

Holdings
Withdrawn status	Lost status	Source of classification or shelving scheme	Damaged status	Not for loan	Home library	Current library	Date acquired	Total Checkouts	Full call number	Barcode	Date last seen	Copy number	Price effective from	Koha item type
					Central Library	Central Library	03/26/2019		621.3973 C435	000645	03/26/2019	C.1	03/26/2019	Books