TY  - BOOK
AU  -  Kanad Chakraborty, Pinaki Mazumder.
TI  - Fault-tolerance and reliability techniques for high-density random-access memories
T2  - Prentice Hall modern semiconductor design series
SN  - 130084654
U1  - 621.3973  C435 
PY  - 2002///
CY  -  N.J
PB  - Prentice Hall
KW  - Random access memory
KW  - Reliability
KW  - Integrated circuits
KW  - Fault tolerance
KW  - Semiconductor storage devices
N1  - Includes bibliographical references (p. 377-417) and index
ER  -