| 000 | 00737nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 190316s2002 gb 000 eng d | ||
| 020 | _a130084654 | ||
| 040 | _aECUCL | ||
| 041 | _aeng | ||
| 082 | 0 | 4 | _a621.3973 C435 |
| 100 | 1 | _a Kanad Chakraborty, Pinaki Mazumder. | |
| 245 | 0 | 0 |
_aFault-tolerance and reliability techniques for high-density random-access memories / _c Kanad Chakraborty, Pinaki Mazumder. |
| 260 |
_a N.J : _bPrentice Hall, _c2002. |
||
| 300 | _axix, 426 p. | ||
| 490 | 0 | 0 | _aPrentice Hall modern semiconductor design series |
| 504 | _aIncludes bibliographical references (p. 377-417) and index. | ||
| 650 | 0 | 4 |
_aRandom access memory _xReliability _xIntegrated circuits _xFault tolerance _xSemiconductor storage devices. |
| 999 |
_c1736 _d1736 |
||