Fault-tolerance and reliability techniques for high-density random-access memories / Kanad Chakraborty, Pinaki Mazumder.
Material type:
TextLanguage: English Series: Prentice Hall modern semiconductor design seriesPublication details: N.J : Prentice Hall, 2002.Description: xix, 426 pISBN: - 130084654
- 621.3973 C435
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| 621.395 K647 Digital electronics : | 621.395 K647 Digital electronics : | 621.395 M285 Digital design / | 621.3973 C435 Fault-tolerance and reliability techniques for high-density random-access memories / | 621.90230285 C976 Computer numerical control : | 624.0684 W177 Project management in construction / | 629.1323 B544 Aerodynamics for engineers / |
Includes bibliographical references (p. 377-417) and index.
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