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Fault-tolerance and reliability techniques for high-density random-access memories / Kanad Chakraborty, Pinaki Mazumder.

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Material type: Text

TextLanguage: English Series: Prentice Hall modern semiconductor design seriesPublication details: N.J : Prentice Hall, 2002.Description: xix, 426 pISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Barcode
Books	Central Library	621.3973 C435 (Browse shelf(Opens below))	C.1	Available	000645

Includes bibliographical references (p. 377-417) and index.

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